SIGNUP - FREE Membership and 1 FREE Sewing Lesson
| FAQ | Login
Platinum Sponsor
Bernina
Bernina

Expo Reviews > American Sewing Expo

Michigan, UNITED STATES
Viewed 5624 times
Posted by: Lis K
photo

 
 
About Lis K
OH USA
Member since: 3/31/08
Reviews: 19 (expos: 2)
Skill level:Advanced
more...
Report a problem with this review
Posted on: 9/28/08 5:35 PM
Rating: starstarstar
Review Rating: Very Helpful by 3 people   
Web site/URL: photo
This year, the emphasis was certainly more on garment construction. Vogue Fabrics of Chicago was there and I had to restrain my wallet from buying too many things. I got to see the new Babylock, Pfaff, Viking and Bernina embroidery machines, which are all too big for travel. I wonder why not spend that money on a home version of a multi-needle embroidery machine? Numbers must have been down as well as vendors, but I had a wonderful time, chatting with representatives. Good to see Jan Bones there with her lingerie patterns. There was a good selection of threads and patterns. I always see something new every year and think this is a great show.

<< Previous    Next >>

Add Sewing Expo Review    Read All Sewing Expo Reviews


3 Comments
Login to Add a Comment
Tina D. said... (9/28/08 10:07 PM) Reply

Tina D. said... (9/28/08 10:07 PM) Reply
Yes, I was there and saw another member from patternreview. I also had a great time.
Mufffet said... (9/28/08 8:06 PM) Reply
Sounds like a lot of fun!
 
adv. search»
pattern | machine | member
        
Online Class
Clone Your Favorite Garment
Clone Your Favorite Garment

Class Details

Online Class
The Contemporary Couture Jacket
The Contemporary Couture Jacket

Class Details

Suzi Purse Insert Paper Pattern

Suzi Purse Insert Paper Pattern

Pattern Details
You Sew Girl Best Dress Pattern

You Sew Girl Best Dress Pattern

Pattern Details

Conditions of Use | Posting Guidelines | Privacy Policy | Shipping Rates | Returns & Refunds | Contact Us | About | New To PR | Advertising

Copyright © 2015 PatternReview.com® , OSATech, Inc. All rights reserved.